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Mahtab Niknahad

Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

(Steinbuch Series on Advances in Information Technology ; 9)

AutorNiknahad, Mahtab

VerlagKIT Scientific Publishing, Karlsruhe

ISBN9783731500384

UmfangIX, 146 S.

Veröffentlicht
am:
18.07.2013

Erscheinungs-
jahr
2013

VerfügbarkeitAktiv

Downloads:

Für Zitate bitte die folgende URL verwenden:
http://dx.doi.org/10.5445/KSP/1000035134

Abstract

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.