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Jürgen Beyerer (Hrsg.), Fernando Puente León, Thomas Längle (Hrsg.)

OCM 2013 - Optical Characterization of Materials - conference proceedings

AutorBeyerer, Jürgen (Hrsg.); Puente León, Fernando ; Längle, Thomas (Hrsg.)

VerlagKIT Scientific Publishing, Karlsruhe

ISBN9783866449657

UmfangX, 285 S.

Veröffentlicht
am:
06.03.2013

Erscheinungs-
jahr
2013

VerfügbarkeitAktiv

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Für Zitate bitte die folgende URL verwenden:
http://dx.doi.org/10.5445/KSP/1000032143

Abstract

The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.