TY - BOOK AU - Müller, Daniel PY - 2018 TI - RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range AB - Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.Umfang: XII, 180 S.Preis: €46.00 | £42.00 | $81.00 PB - KIT Scientific Publishing CY - Karlsruhe KW - Halbleiterschaltungen KW - Messtechnik KW - Hochfrequenztechnik KW - Elektromagnetische Feldsimulation KW - Monolithic Microwave Integrated Circuits KW - Radio Frequency KW - On-Wafer Measurements KW - Electromagnetic Field Simulation SN - 978-3-7315-0822-9 DO - 10.5445/KSP/1000084392 SE - 214