• Part of
    Ubiquity Network logo
    Interesse beim KIT-Verlag zu publizieren? Informationen für Autorinnen und Autoren

    Online lesen
  • No readable formats available
  • OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings

    Jürgen Beyerer, Fernando Puente León, Thomas Längle (eds.)

     Download

    Each material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.

    Umfang: VII,231 S.

    Preis: €47.00 | £43.00 | $83.00

    Wikipedia Concepts

    These are words or phrases in the text that have been automatically identified by the Named Entity Recognition and Disambiguation service, which provides Wikipedia () and Wikidata () links for these entities.

    Metrics:

    Empfohlene Zitierweise
    Beyerer, J et al. (eds.) 2017. OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000063696
    Beyerer, J., Puente León, F. and Längle, T., 2017. OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000063696
    Beyerer, J, et al.. OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings. KIT Scientific Publishing, 2017. DOI: https://doi.org/10.5445/KSP/1000063696
    Beyerer, J., Puente León, F., & Längle, T. (2017). OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000063696
    Beyerer, Jürgen, Fernando Puente León, and Thomas Längle. 2017. OCM 2017 - 3rd International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2017, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000063696




    Export to:




    Lizenz

    Dieses Buch ist lizenziert unter Creative Commons Attribution + ShareAlike 4.0

    Peer Review Informationen

    Dieses Buch ist Peer reviewed. Informationen dazu finden Sie hier

    Weitere Informationen

    Veröffentlicht am 24. März 2017

    Sprache

    Deutsch

    Seitenanzahl:

    250

    ISBN
    Paperback 978-3-7315-0612-6

    DOI
    https://doi.org/10.5445/KSP/1000063696