Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.
Umfang: XII, 180 S.
Preis: €46.00 | £42.00 | $81.00
These are words or phrases in the text that have been automatically identified by the Named Entity Recognition and Disambiguation service, which provides Wikipedia () and Wikidata () links for these entities.
Müller, D. 2018. RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000084392
Dieses Buch ist lizenziert unter Creative Commons Attribution + ShareAlike 4.0 Dedication
Dieses Buch ist Peer reviewed. Informationen dazu finden Sie hier
Veröffentlicht am 22. November 2018